Part of the Oxford Instruments Group
Andor’s Spectroscopy portfolio offers high sensitivity and highly configurable solutions to characterise the chemical, structural, electronic and/or optical properties of a wide range of materials down to the nanoscale with high accuracy and repeatability.
It provides essential tools for the study of structures at the nano-, micro- and macro-scale based on probing techniques including Raman, Photoluminescence / Fluorescence / Cathodoluminescence, Absorption, Optical Emission Spectroscopy and LIBS, Second Harmonic Generation or Darkfield Scattering.
Andor spectroscopy detectors provide the highest sensitivity from UV to SWIR regions, ensuring that information related to chemical signatures, structural changes or photonics properties can be obtained with the highest accuracy and highest reproducibility possible. Our highly configurable spectrographs provide platforms ideal for multimodal setups and a wide range of photon regimes and experiments e.g. micro-spectroscopy.
Material science setups can be complemented by Andor’s high sensitivity and resolution Imaging EMCCD or sCMOS cameras than can provide additional spatial behaviour information on a wide range of microscopy setups. Asylum Research Atomic Force Microscopy (AFM) systems provide complementary type of topological, nano-electrical, nano-mechanical or magnetic information. Oxford Instrument Nanoscience cryostats offer highly controlled environment for the low-temperature study of a wide range of materials including low-dimensional and semiconductor structures.
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