The Vero Interferometric AFM – Advances in Accuracy for Piezoresponse Force Microscopy

Vero is a new AFM that uses an advanced interferometry-based detection system built around a quadrature phase differential interferometer (QPDI). This new technology precisely and accurately measures true tip displacement rather than the traditional detection method which infers displacement from a change in cantilever angle. 

In this application note, we will demonstrate how Vero QPDI:

• Minimizes artifacts that arise when the cantilever bends, but the tip remains fixed
• Avoids crosstalk between vertical and lateral tip forces